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Synthesis and evaluation of fault-tolerant quantum computer architectures

Author(s)
Cross, Andrew W. (Andrew William), 1979-
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Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.
Advisor
Isaac L. Chuang.
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M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
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Abstract
Fault-tolerance is the cornerstone of practical, large-scale quantum computing, pushed into its prominent position with heroic theoretical efforts. The fault-tolerance threshold, which is the component failure probability below which arbitrarily reliable quantum computation becomes possible, is one standard quality measure of fault-tolerant designs based on recursive simulation. However, there is a gulf between theoretical achievements and the physical reality and complexity of envisioned quantum computing systems. This thesis takes a step toward bridging that gap. We develop a new experimental method for estimating fault-tolerance thresholds that applies to realistic models of quantum computer architectures, and demonstrate this technique numerically. We clarify a central problem for experimental approaches to fault-tolerance evaluation--namely, distinguishing between potentially optimistic pseudo-thresholds and actual thresholds that determine scalability. Next, we create a system architecture model for the trapped-ion quantum computer, discuss potential layouts, and numerically estimate the fault-tolerance threshold for this system when it is constrained to a local layout. Finally, we place the problem of evaluation and synthesis of fault-tolerant quantum computers into a broader framework by considering a software architecture for quantum computer design.
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2005.
 
Includes bibliographical references (p. 241-247).
 
Date issued
2005
URI
http://hdl.handle.net/1721.1/30175
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science.

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