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dc.contributor.advisorL. Rafael Reif.en_US
dc.contributor.authorIverson, Ralph Benharten_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2006-05-15T20:12:19Z
dc.date.available2006-05-15T20:12:19Z
dc.date.copyright1987en_US
dc.date.issued1987en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/32570
dc.descriptionBibliography: leaves 118-122.en_US
dc.descriptionThesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1987.en_US
dc.description.statementofresponsibilityby Ralph Benhart Iverson.en_US
dc.format.extent122 leavesen_US
dc.format.extent4990958 bytes
dc.format.extent4997891 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleCrystallization in self-implanted polycrystalline silicon-on-insulator filmsen_US
dc.typeThesisen_US
dc.description.degreePh.D.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc17397325en_US


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