12.141 Electron Microprobe Analysis, January (IAP) 2003

Chatterjee, Nilanjan; Grove, Timothy L.

Author(s)

Chatterjee, Nilanjan; Grove, Timothy L.

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Alternative title

Electron Microprobe Analysis

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Abstract

Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe.

Date issued

2003-01

URI

http://hdl.handle.net/1721.1/35789

Department

Massachusetts Institute of Technology. Department of Earth, Atmospheric, and Planetary Sciences

Other identifiers

12.141-January(IAP)2003

local: 12.141

local: IMSCP-MD5-93cae862f67ea8a9184486512eb71a72

Keywords

x-ray microanalysis, electron microprobe, ZAF matrix corrections, wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, X-ray imaging, Microprobe analysis

Collections

Earth, Atmospheric, and Planetary Sciences (12) -