Modeling for hot-electron reliability simulation

Author(s)
Kim, SeokWon Abraham, 1970-
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Advisor
James E. Chung.
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Description
Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
 
Includes bibliographical references (leaves 74-78).
 
Date issued
1995
URI
http://hdl.handle.net/1721.1/36589
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science
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