| dc.contributor.advisor | James E. Chung. | en_US |
| dc.contributor.author | Kim, SeokWon Abraham, 1970- | en_US |
| dc.date.accessioned | 2007-03-12T17:34:28Z | |
| dc.date.available | 2007-03-12T17:34:28Z | |
| dc.date.copyright | 1995 | en_US |
| dc.date.issued | 1995 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/36589 | |
| dc.description | Thesis (M. Eng.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. | en_US |
| dc.description | Includes bibliographical references (leaves 74-78). | en_US |
| dc.description.statementofresponsibility | by Jeffery Seokwon Kim. | en_US |
| dc.format.extent | 88 leaves | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Electrical Engineering and Computer Science | en_US |
| dc.title | Modeling for hot-electron reliability simulation | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.Eng. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 33349949 | en_US |
