MIT Libraries logoDSpace@MIT

MIT
View Item 
  • DSpace@MIT Home
  • Singapore-MIT Alliance (SMA)
  • Innovation in Manufacturing Systems and Technology (IMST)
  • View Item
  • DSpace@MIT Home
  • Singapore-MIT Alliance (SMA)
  • Innovation in Manufacturing Systems and Technology (IMST)
  • View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.

Multiple Input-Multiple Output Cycle-to-Cycle Control of Manufacturing Processes

Author(s)
Rzepniewski, Adam K.; Hardt, David E.
Thumbnail
DownloadIMST014.pdf (1020.Kb)
Metadata
Show full item record
Abstract
Cycle-to-cycle control is a method for using feedback to improve product quality for processes that are inaccessible within a single processing cycle. This limitation stems from the impossibility or the prohibitively high cost of placing sensors and actuators that could facilitate control during, or within, the process cycle. Our previous work introduced cycle to cycle control for single input-single output systems, and here it is extended to multiple input-multiple output systems. Gain selection, stability, and process noise amplification results are developed and compared with those obtained by previous researchers, showing good agreement. The limitation of imperfect knowledge of the plant model is then imposed. This is consistent with manufacturing environments where the cost and number of tests to determine a valid process model is desired to be minimal. The implications of this limitation are modes of response that are hidden from the controller. Their effects on system performance and stability are discussed.
Date issued
2003-01
URI
http://hdl.handle.net/1721.1/3748
Series/Report no.
Innovation in Manufacturing Systems and Technology (IMST);
Keywords
multivariable control, cycle to cycle, discrete event

Collections
  • Innovation in Manufacturing Systems and Technology (IMST)

Browse

All of DSpaceCommunities & CollectionsBy Issue DateAuthorsTitlesSubjectsThis CollectionBy Issue DateAuthorsTitlesSubjects

My Account

Login

Statistics

OA StatisticsStatistics by CountryStatistics by Department
MIT Libraries
PrivacyPermissionsAccessibilityContact us
MIT
Content created by the MIT Libraries, CC BY-NC unless otherwise noted. Notify us about copyright concerns.