Design of an automatic defect tracking and yield reporting system for the manufacturing floor

Author(s)
Lee, Edward Matthew
Thumbnail
DownloadFull printable version (26.04Mb)
Advisor
Kevin Otto, Roy E. Welsch.
Terms of use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
Metadata
Show full item record
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1994.
 
Includes bibliographical references (leaf 100).
 
Date issued
1994
URI
http://hdl.handle.net/1721.1/37739
Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Publisher
Massachusetts Institute of Technology
Keywords
Mechanical Engineering
Collections