Design of an automatic defect tracking and yield reporting system for the manufacturing floor
Author(s)
Lee, Edward Matthew![Thumbnail](/bitstream/handle/1721.1/37739/31451955-MIT.pdf.jpg?sequence=4&isAllowed=y)
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Advisor
Kevin Otto, Roy E. Welsch.
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Show full item recordDescription
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1994. Includes bibliographical references (leaf 100).
Date issued
1994Department
Massachusetts Institute of Technology. Department of Mechanical EngineeringPublisher
Massachusetts Institute of Technology
Keywords
Mechanical Engineering