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dc.contributor.advisorKevin Otto, Roy E. Welsch.en_US
dc.contributor.authorLee, Edward Matthewen_US
dc.date.accessioned2007-06-28T12:31:12Z
dc.date.available2007-06-28T12:31:12Z
dc.date.copyright1994en_US
dc.date.issued1994en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/37739
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 1994.en_US
dc.descriptionIncludes bibliographical references (leaf 100).en_US
dc.description.statementofresponsibilityby Edward Matthew Lee.en_US
dc.format.extent137 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMechanical Engineeringen_US
dc.titleDesign of an automatic defect tracking and yield reporting system for the manufacturing flooren_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc31451955en_US


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