Toward the measurement of reliable grain-boundary diffusion coefficients in oxides
Author(s)
Chung, Yong-Chae
DownloadFull printable version (14.89Mb)
Advisor
Bernhardt J. Wuensch.
Terms of use
Metadata
Show full item recordDescription
Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995. Includes bibliographical references (leaves 221-231).
Date issued
1995Department
Massachusetts Institute of Technology. Department of Materials Science and EngineeringPublisher
Massachusetts Institute of Technology
Keywords
Materials Science and Engineering