| dc.contributor.advisor | Bernhardt J. Wuensch. | en_US |
| dc.contributor.author | Chung, Yong-Chae | en_US |
| dc.date.accessioned | 2007-07-18T13:37:01Z | |
| dc.date.available | 2007-07-18T13:37:01Z | |
| dc.date.copyright | 1995 | en_US |
| dc.date.issued | 1995 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/38105 | |
| dc.description | Thesis (Ph. D.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995. | en_US |
| dc.description | Includes bibliographical references (leaves 221-231). | en_US |
| dc.description.statementofresponsibility | by Yong-Chae Chung. | en_US |
| dc.format.extent | 231 leaves | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Materials Science and Engineering | en_US |
| dc.title | Toward the measurement of reliable grain-boundary diffusion coefficients in oxides | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | Ph.D. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Materials Science and Engineering | |
| dc.identifier.oclc | 34224016 | en_US |
