Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing

Author(s)
Haag, Lance Edward
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Advisor
Steven D. Eppinger.
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Description
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1995, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995.
 
Includes bibliographical references (leaves 66-67).
 
Date issued
1995
URI
http://hdl.handle.net/1721.1/38107
Department
Sloan School of Management; Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Sloan School of Management, Electrical Engineering and Computer Science
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