| dc.contributor.advisor | Steven D. Eppinger. | en_US |
| dc.contributor.author | Haag, Lance Edward | en_US |
| dc.date.accessioned | 2007-07-18T13:37:20Z | |
| dc.date.available | 2007-07-18T13:37:20Z | |
| dc.date.copyright | 1995 | en_US |
| dc.date.issued | 1995 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/38107 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1995, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1995. | en_US |
| dc.description | Includes bibliographical references (leaves 66-67). | en_US |
| dc.description.statementofresponsibility | by Lance Edward Haag. | en_US |
| dc.format.extent | 68 leaves | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Sloan School of Management | en_US |
| dc.subject | Electrical Engineering and Computer Science | en_US |
| dc.title | Effective use of test data for quality improvement and cycle time reduction in radio system manufacturing | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Sloan School of Management | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 34296136 | en_US |
