Simulation of the effect of microstructure on electromigration induced failure of interconnects
Author(s)
Fayad, Walid R. (Walid Rahif)
DownloadFull printable version (4.836Mb)
Advisor
Carl V. Thompson.
Terms of use
Metadata
Show full item recordDescription
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 1997. Includes bibliographical references (leaves 85-87).
Date issued
1997Department
Massachusetts Institute of Technology. Department of Civil and Environmental EngineeringPublisher
Massachusetts Institute of Technology
Keywords
Civil and Environmental Engineering