| dc.contributor.advisor | Carl V. Thompson. | en_US |
| dc.contributor.author | Fayad, Walid R. (Walid Rahif) | en_US |
| dc.date.accessioned | 2009-04-29T17:48:07Z | |
| dc.date.available | 2009-04-29T17:48:07Z | |
| dc.date.copyright | 1997 | en_US |
| dc.date.issued | 1997 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/45477 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Civil and Environmental Engineering, 1997. | en_US |
| dc.description | Includes bibliographical references (leaves 85-87). | en_US |
| dc.description.statementofresponsibility | by Walid R. Fayad. | en_US |
| dc.format.extent | 87 leaves | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Civil and Environmental Engineering | en_US |
| dc.title | Simulation of the effect of microstructure on electromigration induced failure of interconnects | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Civil and Environmental Engineering | |
| dc.identifier.oclc | 37519913 | en_US |
