dc.contributor.author | Mueller, Peter | en_US |
dc.coverage.temporal | Spring 2005 | en_US |
dc.date.issued | 2005-06 | |
dc.identifier | 5.068-Spring2005 | |
dc.identifier | local: 5.068 | |
dc.identifier | local: IMSCP-MD5-aafc99e687caff0c3eff57d1d20587e2 | |
dc.identifier.uri | http://hdl.handle.net/1721.1/45590 | |
dc.description.abstract | Introduction to the study of physical methods to probe the electronic and geometric structure of inorganic compounds. Included are electronic photoelectron spectroscopy; vibrational and rotational spectroscopy; magnetic measurements (including electron and nuclear spin resonance); Mossbauer spectroscopy; mass spectrometry; electrochemical measurements and crystallographic chemical analysis (including hands-on use of departmental facilities). From the course home page: Course Description This course covers the following topics: X-ray diffraction: symmetry, space groups, geometry of diffraction, structure factors, phase problem, direct methods, Patterson methods, electron density maps, structure refinement, how to grow good crystals, powder methods, limits of X-ray diffraction methods, and structure data bases. | en_US |
dc.language | en-US | en_US |
dc.relation | | en_US |
dc.rights.uri | Usage Restrictions: This site (c) Massachusetts Institute of Technology 2003. Content within individual courses is (c) by the individual authors unless otherwise noted. The Massachusetts Institute of Technology is providing this Work (as defined below) under the terms of this Creative Commons public license ("CCPL" or "license"). The Work is protected by copyright and/or other applicable law. Any use of the work other than as authorized under this license is prohibited. By exercising any of the rights to the Work provided here, You (as defined below) accept and agree to be bound by the terms of this license. The Licensor, the Massachusetts Institute of Technology, grants You the rights contained here in consideration of Your acceptance of such terms and conditions. | en_US |
dc.subject | crystallography | en_US |
dc.subject | inorganic chemistry | en_US |
dc.subject | physical methods | en_US |
dc.subject | crystal structure determination | en_US |
dc.subject | 3D structure | en_US |
dc.subject | x-ray crystallagraphy | en_US |
dc.subject | diffraction | en_US |
dc.subject | x-rays | en_US |
dc.subject | symmetry | en_US |
dc.subject | phasing | en_US |
dc.subject | crystal structure | en_US |
dc.subject | symmetry operations | en_US |
dc.subject | crystal lattice | en_US |
dc.subject | structure refinement | en_US |
dc.subject | electron density maps | en_US |
dc.subject | space group determination | en_US |
dc.subject | phasing | en_US |
dc.subject | anomalous scattering | en_US |
dc.title | 5.068 Physical Methods in Inorganic Chemistry, Spring 2005 | en_US |
dc.title.alternative | Physical Methods in Inorganic Chemistry | en_US |
dc.type | Learning Object | |
dc.contributor.department | Massachusetts Institute of Technology. Department of Chemistry | |