Show simple item record

dc.contributor.authorKempthorne, Peter J.en_US
dc.contributor.authorMendel, Max B.en_US
dc.contributor.otherSloan School of Management.en_US
dc.date.accessioned2009-09-29T17:57:45Z
dc.date.available2009-09-29T17:57:45Z
dc.date.issued1989en_US
dc.identifierbayesianparametr00kempen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/46950
dc.publisherCambridge, Mass. : Alfred P. Sloan School of Management, Massachusetts Institute of Technologyen_US
dc.relation.ispartofseriesWorking paper (Sloan School of Management) ; 3021-89.en_US
dc.titleBayesian parametric modelsen_US
dc.typeWorking Paperen_US
dc.identifier.oclc20741467en_US
dc.identifier.aleph000400527en_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record