Procedure for optimal D.C. parameter extraction for hot-carrier degradation model calibration and verification

Author(s)
Dao, Steve Gia, 1973-
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Advisor
James Chung.
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Description
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1998.
 
Includes bibliographical references (leaves 98-100).
 
Date issued
1998
URI
http://hdl.handle.net/1721.1/47435
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science
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