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dc.contributor.authorWelsch, Roy E.en_US
dc.contributor.authorKuh, Edwinen_US
dc.contributor.otherNBER Computer Research Center.en_US
dc.date.accessioned2009-10-02T20:26:35Z
dc.date.available2009-10-02T20:26:35Z
dc.date.issued1977en_US
dc.identifierlinearregression00welsen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/48325
dc.publisherCambridge, Mass. : Alfred P. Sloan School of Management, Massachusetts Institute of Technologyen_US
dc.relation.ispartofseriesWorking paper (Sloan School of Management) ; 923-77.en_US
dc.titleLinear regression diagnosticsen_US
dc.typeWorking Paperen_US
dc.identifier.oclc09583934en_US
dc.identifier.aleph000150822en_US


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