| dc.contributor.author | Hauser, John R. | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. | en_US |
| dc.contributor.other | Sloan School of Management. | en_US |
| dc.date.accessioned | 2009-10-03T03:23:33Z | |
| dc.date.available | 2009-10-03T03:23:33Z | |
| dc.date.issued | 1996] | en_US |
| dc.identifier | metricstovaluerd00haus | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/48461 | |
| dc.description | "March 1996, Revised." | en_US |
| dc.description | At head of title: MIT Sloan. The International Center for Research on the Management of Technology. | en_US |
| dc.publisher | Cambridge, Mass. : Sloan School of Management, Massachusetts Institute of Technology | en_US |
| dc.relation | Also available as PDF via the Internet at the MIT Website. -- Version online is later version dated June 19, 1996. 66 p. | en_US |
| dc.relation.ispartofseries | CCSTR ; 143. | en_US |
| dc.relation.ispartofseries | Working paper (Sloan School of Management) ; 3885. | en_US |
| dc.subject | Research, Industrial | en_US |
| dc.subject | Measurement | en_US |
| dc.subject | Evaluation | en_US |
| dc.subject | Bibliography. | en_US |
| dc.title | Metrics to value R&D : an annotated bibliography | en_US |
| dc.type | Working Paper | en_US |
| dc.identifier.oclc | 50256796 | en_US |
| dc.identifier.aleph | 001120119 | en_US |
