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dc.contributor.authorBarouch, Eytan.en_US
dc.contributor.authorChow, S.en_US
dc.contributor.authorKaufman, G. M.en_US
dc.contributor.authorWright, T.en_US
dc.date.accessioned2009-10-04T03:28:58Z
dc.date.available2009-10-04T03:28:58Z
dc.date.issued1985en_US
dc.identifierpropertiesofsucc00baroen_US
dc.identifier.urihttp://hdl.handle.net/1721.1/48755
dc.publisherCambridge, Mass. : Massachusetts Institute of Technology, Alfred P. Sloan School of Managementen_US
dc.relation.ispartofseriesWorking paper (Sloan School of Management) ; 1648-85.en_US
dc.titleProperties of successive sample moment estimatorsen_US
dc.typeWorking Paperen_US
dc.identifier.oclc12783320en_US
dc.identifier.aleph000227822en_US


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