Sequential screening in semiconductor manufacturing.
| dc.contributor.author | Ou, Jihong. | en_US |
| dc.contributor.author | Wein, Lawrence M. | en_US |
| dc.date.accessioned | 2009-10-05T20:43:35Z | |
| dc.date.available | 2009-10-05T20:43:35Z | |
| dc.date.issued | en_US | |
| dc.identifier | sequentialscreen00ouji | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/49026 | |
| dc.publisher | Cambridge, Mass. : Alfred P. Sloan School of Management, Massachusetts Institute of Technology, 1992 | en_US |
| dc.relation.ispartofseries | Working paper (Sloan School of Management) ; 3451-92. | en_US |
| dc.title | Sequential screening in semiconductor manufacturing. | en_US |
| dc.type | Working Paper | en_US |
| dc.identifier.oclc | 26776374 | en_US |
| dc.identifier.aleph | 000625124 | en_US |
