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Developing a methodology to link printed circuit board assembly yield targets to commodity group quality goals

Author(s)
Cauthen, Jason Wessing
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Other Contributors
Leaders for Manufacturing Program.
Advisor
Roy E. Welsch and David Hardt.
Terms of use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
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Abstract
The increasing complexity of high-end routing products, a highly diverse product mix, and continually demanding quality requirements have intensified the challenges faced by Cisco. Primary among these is managing the broad array of suppliers to ensure that the parts they are delivering meet the quality needs of the end product while balancing this with the need to remain cost competitive. Because components are often used across many product lines, it is can be difficult to determine exactly how an improvement to the quality of an individual component will impact Cisco's overall yield metrics. This thesis establishes a methodology for linking component quality to assembly-level yields. The component level quality is measured in Defective Parts Per Million (DPPM) at the Commodity Group level, and PCBA Yield is measured as the percentage of boards which meet Cisco's Six Sigma yield targets. The proof of concept for such an analytical link shows that these two metrics can be analytically related, and furthermore can be used to ensure that the effort expended to improve DPPM is optimally targeted to have an impact on assembly-level yields.
Description
Thesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Engineering Systems Division; in conjunction with the Leaders for Manufacturing Program at MIT, 2009.
 
Includes bibliographical references (p. 62-63).
 
Date issued
2009
URI
http://hdl.handle.net/1721.1/49789
Department
Leaders for Manufacturing Program at MIT; Massachusetts Institute of Technology. Engineering Systems Division; Sloan School of Management
Publisher
Massachusetts Institute of Technology
Keywords
Sloan School of Management., Engineering Systems Division., Leaders for Manufacturing Program.

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