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dc.contributor.advisorRoy E. Welsch and David Hardt.en_US
dc.contributor.authorCauthen, Jason Wessingen_US
dc.contributor.otherLeaders for Manufacturing Program.en_US
dc.date.accessioned2009-11-06T16:35:36Z
dc.date.available2009-11-06T16:35:36Z
dc.date.copyright2009en_US
dc.date.issued2009en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/49789
dc.descriptionThesis (M.B.A.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Engineering Systems Division; in conjunction with the Leaders for Manufacturing Program at MIT, 2009.en_US
dc.descriptionIncludes bibliographical references (p. 62-63).en_US
dc.description.abstractThe increasing complexity of high-end routing products, a highly diverse product mix, and continually demanding quality requirements have intensified the challenges faced by Cisco. Primary among these is managing the broad array of suppliers to ensure that the parts they are delivering meet the quality needs of the end product while balancing this with the need to remain cost competitive. Because components are often used across many product lines, it is can be difficult to determine exactly how an improvement to the quality of an individual component will impact Cisco's overall yield metrics. This thesis establishes a methodology for linking component quality to assembly-level yields. The component level quality is measured in Defective Parts Per Million (DPPM) at the Commodity Group level, and PCBA Yield is measured as the percentage of boards which meet Cisco's Six Sigma yield targets. The proof of concept for such an analytical link shows that these two metrics can be analytically related, and furthermore can be used to ensure that the effort expended to improve DPPM is optimally targeted to have an impact on assembly-level yields.en_US
dc.description.statementofresponsibilityby Jason Wessing Cauthen.en_US
dc.format.extent63 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectSloan School of Management.en_US
dc.subjectEngineering Systems Division.en_US
dc.subjectLeaders for Manufacturing Program.en_US
dc.titleDeveloping a methodology to link printed circuit board assembly yield targets to commodity group quality goalsen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.description.degreeM.B.A.en_US
dc.contributor.departmentLeaders for Manufacturing Program at MITen_US
dc.contributor.departmentMassachusetts Institute of Technology. Engineering Systems Division
dc.contributor.departmentSloan School of Management
dc.identifier.oclc457232397en_US


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