An x-ray method for measuring the thickness of thin crystalline films

Author(s)
Eisenstein, A. S.
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Description
"Reprinted from Journal of applied physics, vol. 17, No. 11, 874-878, November, 1946."
 
Includes bibliographical references.
 
Date issued
1946
URI
http://hdl.handle.net/1721.1/5029
Publisher
Research Laboratory of Electronics, Massachusetts Institute of Technology
Other identifiers
no. 17
Series/Report no.
Technical report (Massachusetts Institute of Technology. Research Laboratory of Electronics) ; 17.
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