Show simple item record

dc.contributor.authorLezec, Henri J.en_US
dc.contributor.authorShepard, Mark I.en_US
dc.contributor.authorMelngailis, Johnen_US
dc.contributor.authorMahoney, Leonard J.en_US
dc.contributor.authorMusil, Christian R.en_US
dc.contributor.authorIsmail, Khaliden_US
dc.contributor.authorAntoniadis, Dimitri A.en_US
dc.contributor.authorHerndon, Terry O.en_US
dc.contributor.authorRo, Jaesangen_US
dc.contributor.authorDubner, Andrew D.en_US
dc.contributor.authorBlauner, Patricia G.en_US
dc.contributor.authorThompson, Carl V.en_US
dc.date.accessioned2010-07-16T03:46:13Z
dc.date.available2010-07-16T03:46:13Z
dc.date.issued1987-01-01 to 1987-12-31en_US
dc.identifierRLE_PR_130_03en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/57025
dc.descriptionContains reports on four sections of one research project.en_US
dc.description.sponsorshipMicrosystems Technology Laboratoriesen_US
dc.description.sponsorshipDefense Advanced Research Projects Agency/Naval Electronics Systems Command (Contract MDA 903-85-C-0215)en_US
dc.description.sponsorshipU.S. Air Force (through Lincoln Laboratory)en_US
dc.description.sponsorshipDefense Advanced Research Projects Agency (through Lincoln Laboratory)en_US
dc.description.sponsorshipCharles Stark Draper Laboratory, Inc. (Contract DL-H-261827)en_US
dc.description.sponsorshipHitachi Central Research Laboratoryen_US
dc.description.sponsorshipNippon Telegraph & Telephoneen_US
dc.description.sponsorshipU.S. Army Research Office (Contract DAALO3-87-K-0126)en_US
dc.language.isoenen_US
dc.publisherResearch Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT)en_US
dc.relation.ispartofMassachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1987en_US
dc.relation.ispartofFocused Ion Beam Fabricationen_US
dc.relation.ispartofseriesMassachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 130en_US
dc.rightsCopyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved.en_US
dc.subject.otherFocused Ion Beam Fabricationen_US
dc.subject.otherFocused Ion Beam Programen_US
dc.titleFocused Ion Beam Fabricationen_US
dc.typeTechnical Reporten_US


Files in this item

Thumbnail

This item appears in the following Collection(s)

Show simple item record