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dc.contributor.advisorIsaac L. Chuang.en_US
dc.contributor.authorFisher, Zachary (Zachary Kenneth)en_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Physics.en_US
dc.date.accessioned2013-04-12T19:31:06Z
dc.date.available2013-04-12T19:31:06Z
dc.date.copyright2012en_US
dc.date.issued2012en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/78510
dc.descriptionThesis (S.B.)--Massachusetts Institute of Technology, Dept. of Physics, 2012.en_US
dc.descriptionCataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (p. 65-67).en_US
dc.description.abstractIn this thesis, I present experimental results demonstrating the characterization of a planar Paul trap. I discuss the theory of ion trapping and analyze the voltages required for shuttling. Next, the characteristics of a digital-to-analog converter (DAC) are calibrated, and this instrument is integrated into trapping experiments to test the viability of the analytic model. Combining theory with the capabilities of the DAC, I calculate that the new experimental system is capable of 3 nm-precision control of the ion. Taking advantage of this ion control, I present initial results for a lock-in micromotion detection method which minimizes stray fields around an ⁸⁸Sr+ ion using Fourier analysis on the ion fluorescence to detect resonance at the secular frequencies. This method drives the ion oscillator across resonance using a superimposed radiofrequency electric field, which allows for off-axis field measurements as well as trap characterization. With this method, the secular frequencies of the trap are measured and are observed to fall within 3.50[sigma] of the analytic prediction.en_US
dc.description.statementofresponsibilityby Zachary Fisher.en_US
dc.format.extent67 p.en_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectPhysics.en_US
dc.titleShuttling of ions for characterization of a microfabricated ion trapen_US
dc.typeThesisen_US
dc.description.degreeS.B.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physics.en_US
dc.identifier.oclc836796500en_US


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