Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes
Author(s)
Howe, Jonathan E. (Jonathan Emerson), 1973-
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Other Contributors
Massachusetts Institute of Technology. Department of Mechanical Engineering.
Advisor
Stephen C. Graves and Stanley B. Gershwin.
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Metadata
Show full item recordDescription
Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001. Includes bibliographical references (p. 73).
Date issued
2001Department
Massachusetts Institute of Technology. Department of Mechanical Engineering; Sloan School of ManagementPublisher
Massachusetts Institute of Technology
Keywords
Sloan School of Management., Mechanical Engineering.