| dc.contributor.advisor | Stephen C. Graves and Stanley B. Gershwin. | en_US |
| dc.contributor.author | Howe, Jonathan E. (Jonathan Emerson), 1973- | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Department of Mechanical Engineering. | en_US |
| dc.date.accessioned | 2014-01-23T18:29:59Z | |
| dc.date.available | 2014-01-23T18:29:59Z | |
| dc.date.copyright | 2001 | en_US |
| dc.date.issued | 2001 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/84226 | |
| dc.description | Thesis (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; and, (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001. | en_US |
| dc.description | Includes bibliographical references (p. 73). | en_US |
| dc.description.statementofresponsibility | by Jonathan E. Howe. | en_US |
| dc.format.extent | 82 p. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Sloan School of Management. | en_US |
| dc.subject | Mechanical Engineering. | en_US |
| dc.title | Minimizing the risk qualification test wafers have on the manufacturing readings of a new microprocessor fabrication site through data processes | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | S.M. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | |
| dc.contributor.department | Sloan School of Management | |
| dc.identifier.oclc | 48862861 | en_US |
