| dc.contributor.advisor | Marc A. Baldo. | en_US |
| dc.contributor.author | Yin, Allen Shiping | en_US |
| dc.contributor.other | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science. | en_US |
| dc.date.accessioned | 2014-03-05T15:56:46Z | |
| dc.date.available | 2014-03-05T15:56:46Z | |
| dc.date.copyright | 2012 | en_US |
| dc.date.issued | 2012 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/85231 | |
| dc.description | Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2012. | en_US |
| dc.description | This electronic version was submitted by the student author. The certified thesis is available in the Institute Archives and Special Collections. | en_US |
| dc.description | Cataloged from student-submitted PDF version of thesis. | en_US |
| dc.description | Includes bibliographical references (pages 91-92). | en_US |
| dc.description.abstract | Lithography processes harnessing the phase change of the chemically inert carbon dioxide as a resist have been shown as a possible alternative to patterning thin film organic semiconductors and metals. The ability to control the resist's growth would make the lithography process more reliable and ecient. This thesis seeks to control and observe the physical properties of the carbon dioxide resist via the optical technique of dual-laser interferometry in conjunction with a quartz crystal micro balance (QCMB). | en_US |
| dc.description.statementofresponsibility | by Allen Shiping Yin. | en_US |
| dc.format.extent | 92 pages | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Electrical Engineering and Computer Science. | en_US |
| dc.title | A dual-laser interferometry system for thin film measurements in thermal vapor deposition applications | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M. Eng. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 871171491 | en_US |
