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A machine for tribological experimentation on indexing continuous media with specific application to semiconductor testing

Author(s)
Sprunt, Alexander D. (Alexander Dalziel), 1977-
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Massachusetts Institute of Technology. Dept. of Mechanical Engineering.
Advisor
Alexander H. Slocum.
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M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
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Abstract
Technology was developed to facilitate electrical contact tribology experiments on continuous media, dramatically reducing the difficulty of employing virgin material for each test. Specifically, a tester was designed to accurately reproduce semiconductor contactor operating environments while measuring contact resistance in-situ, thereby effecting the study of operating temperature, test current, cleaning method, and cleaning interval on contactor life. To manipulate the continuous media while preserving exact constraint, novel web handling machine elements were devised. Universal joints and beam type flexible couplings were employed for gimballing and castering axes, both at standard caster radii and at roller center. A kinematic edge constraint was designed. The torque transmission properties of clamped connections were alloyed to the favorable kinematics of typical pinned type connections by compliantly mounting a spherical roller bearing as a pinch roller.
Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.
 
Includes bibliographical references (p. 103).
 
Date issued
2001
URI
http://hdl.handle.net/1721.1/8555
Department
Massachusetts Institute of Technology. Department of Mechanical Engineering
Publisher
Massachusetts Institute of Technology
Keywords
Mechanical Engineering.

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