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dc.contributor.advisorAlexander H. Slocum.en_US
dc.contributor.authorSprunt, Alexander D. (Alexander Dalziel), 1977-en_US
dc.contributor.otherMassachusetts Institute of Technology. Dept. of Mechanical Engineering.en_US
dc.date.accessioned2005-08-23T21:13:49Z
dc.date.available2005-08-23T21:13:49Z
dc.date.copyright2001en_US
dc.date.issued2001en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/8555
dc.descriptionThesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, 2001.en_US
dc.descriptionIncludes bibliographical references (p. 103).en_US
dc.description.abstractTechnology was developed to facilitate electrical contact tribology experiments on continuous media, dramatically reducing the difficulty of employing virgin material for each test. Specifically, a tester was designed to accurately reproduce semiconductor contactor operating environments while measuring contact resistance in-situ, thereby effecting the study of operating temperature, test current, cleaning method, and cleaning interval on contactor life. To manipulate the continuous media while preserving exact constraint, novel web handling machine elements were devised. Universal joints and beam type flexible couplings were employed for gimballing and castering axes, both at standard caster radii and at roller center. A kinematic edge constraint was designed. The torque transmission properties of clamped connections were alloyed to the favorable kinematics of typical pinned type connections by compliantly mounting a spherical roller bearing as a pinch roller.en_US
dc.description.statementofresponsibilityby Alexander D. Sprunt.en_US
dc.format.extent112 p., [58] leaves of platesen_US
dc.format.extent12041915 bytes
dc.format.extent12041676 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypeapplication/pdf
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMechanical Engineering.en_US
dc.titleA machine for tribological experimentation on indexing continuous media with specific application to semiconductor testingen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Mechanical Engineering
dc.identifier.oclc49038764en_US


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