Relating process measurements to customer dissatisfiers
Author(s)Schaefer, Mark Stephen, 1972-
Sloan School of Management.
Roy E. Welsch and Daniel E. Whitney.
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Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management, 2000.Includes bibliographical references (p. 82).
DepartmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Sloan School of Management
Massachusetts Institute of Technology
Electrical Engineering and Computer Science., Sloan School of Management.