Relating process measurements to customer dissatisfiers
Author(s)
Schaefer, Mark Stephen, 1972-
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Other Contributors
Sloan School of Management.
Advisor
Roy E. Welsch and Daniel E. Whitney.
Terms of use
Metadata
Show full item recordDescription
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management, 2000. Includes bibliographical references (p. 82).
Date issued
2000Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Sloan School of ManagementPublisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science., Sloan School of Management.