Relating process measurements to customer dissatisfiers

Author(s)
Schaefer, Mark Stephen, 1972-
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Other Contributors
Sloan School of Management.
Advisor
Roy E. Welsch and Daniel E. Whitney.
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Description
Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management, 2000.
 
Includes bibliographical references (p. 82).
 
Date issued
2000
URI
http://hdl.handle.net/1721.1/86550
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science; Sloan School of Management
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science., Sloan School of Management.
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