| dc.contributor.advisor | Roy E. Welsch and Daniel E. Whitney. | en_US |
| dc.contributor.author | Schaefer, Mark Stephen, 1972- | en_US |
| dc.contributor.other | Sloan School of Management. | en_US |
| dc.date.accessioned | 2014-05-07T16:48:47Z | |
| dc.date.available | 2014-05-07T16:48:47Z | |
| dc.date.copyright | 2000 | en_US |
| dc.date.issued | 2000 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/86550 | |
| dc.description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management, 2000. | en_US |
| dc.description | Includes bibliographical references (p. 82). | en_US |
| dc.description.statementofresponsibility | by Mark Stephen Schaefer. | en_US |
| dc.format.extent | 92 p. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Electrical Engineering and Computer Science. | en_US |
| dc.subject | Sloan School of Management. | en_US |
| dc.title | Relating process measurements to customer dissatisfiers | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | S.M. | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.contributor.department | Sloan School of Management | |
| dc.identifier.oclc | 46925495 | en_US |
