| dc.contributor.advisor | Daniel E. Whitney and Roy E. Welsch. | en_US |
| dc.contributor.author | Evans, Thomas C. (Thomas Carl), 1971- | en_US |
| dc.contributor.other | Leaders for Manufacturing Program. | en_US |
| dc.date.accessioned | 2014-09-09T17:58:25Z | |
| dc.date.available | 2014-09-09T17:58:25Z | |
| dc.date.copyright | 2003 | en_US |
| dc.date.issued | 2003 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/89389 | |
| dc.description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering; and, (S.M.)--Massachusetts Institute of Technology, Sloan School of Management; in conjunction with the Leaders for Manufacturing Program at MIT, 2003. | en_US |
| dc.description | Includes bibliographical references (p. 77). | en_US |
| dc.description.statementofresponsibility | by Thomas C. Evans. | en_US |
| dc.format.extent | 77 p. | en_US |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
| dc.subject | Mechanical Engineering. | en_US |
| dc.subject | Sloan School of Management. | en_US |
| dc.subject | Leaders for Manufacturing Program. | en_US |
| dc.title | Statistical usage models in mobile processor thermal design and testing | en_US |
| dc.title.alternative | Statistical usage models in mobile microprocessor thermal design and testing | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | S.M. | en_US |
| dc.contributor.department | Leaders for Manufacturing Program at MIT | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Mechanical Engineering | |
| dc.contributor.department | Sloan School of Management | |
| dc.identifier.oclc | 53362268 | en_US |
