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Testing shape restriction properties of probability distributions in a unified way

Author(s)
Gouleakis, Themistoklis
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Alternative title
Testing and correcting probability distributions
Other Contributors
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.
Advisor
Ronitt Rubinfeld.
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M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
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Abstract
We study the question of testing structured properties of discrete distributions. Specifically, given sample access to an arbitrary distribution D over [n] and a property P, the goal is to distinguish between ... Building on a result of [9], we develop a general algorithm for this question, which applies to a large range of "shape-constrained" properties, including monotone, log-concave, t-modal and Poisson Binomial distributions. Our generic property tester works for properties that exclusively contain distributions which can be well approximated by L-histograms for a small (usually logarithmic in the domain size) value of L. The sample complexity of this generic approach is ... Moreover, for all cases considered, our algorithm has near-optimal sample complexity. Finally, we also describe a generic method to prove lower bounds for this problem, and use it to derive strong converses to our algorithmic results. More specifically, we use the following reduction technique: we compose the property tester for a class-C of distributions with an agnostic learner for that same class to get a tester for subset CHARD ... C for which a lower bound is known.
Description
Thesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.
 
Title as it appears in MIT Commencement Exercises program, June 5, 2015: Testing and correcting probability distributions. Cataloged from PDF version of thesis.
 
Includes bibliographical references (pages 61-63).
 
Date issued
2015
URI
http://hdl.handle.net/1721.1/99864
Department
Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Electrical Engineering and Computer Science.

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