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dc.contributor.advisorRonitt Rubinfeld.en_US
dc.contributor.authorGouleakis, Themistoklisen_US
dc.contributor.otherMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science.en_US
dc.date.accessioned2015-11-09T19:53:56Z
dc.date.available2015-11-09T19:53:56Z
dc.date.copyright2015en_US
dc.date.issued2015en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/99864
dc.descriptionThesis: S.M., Massachusetts Institute of Technology, Department of Electrical Engineering and Computer Science, 2015.en_US
dc.descriptionTitle as it appears in MIT Commencement Exercises program, June 5, 2015: Testing and correcting probability distributions. Cataloged from PDF version of thesis.en_US
dc.descriptionIncludes bibliographical references (pages 61-63).en_US
dc.description.abstractWe study the question of testing structured properties of discrete distributions. Specifically, given sample access to an arbitrary distribution D over [n] and a property P, the goal is to distinguish between ... Building on a result of [9], we develop a general algorithm for this question, which applies to a large range of "shape-constrained" properties, including monotone, log-concave, t-modal and Poisson Binomial distributions. Our generic property tester works for properties that exclusively contain distributions which can be well approximated by L-histograms for a small (usually logarithmic in the domain size) value of L. The sample complexity of this generic approach is ... Moreover, for all cases considered, our algorithm has near-optimal sample complexity. Finally, we also describe a generic method to prove lower bounds for this problem, and use it to derive strong converses to our algorithmic results. More specifically, we use the following reduction technique: we compose the property tester for a class-C of distributions with an agnostic learner for that same class to get a tester for subset CHARD ... C for which a lower bound is known.en_US
dc.description.statementofresponsibilityby Themistoklis Gouleakis.en_US
dc.format.extent63 pagesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582en_US
dc.subjectElectrical Engineering and Computer Science.en_US
dc.titleTesting shape restriction properties of probability distributions in a unified wayen_US
dc.title.alternativeTesting and correcting probability distributionsen_US
dc.typeThesisen_US
dc.description.degreeS.M.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
dc.identifier.oclc928001806en_US


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