Improving production testing of RF products in a noisy measurement environment
Author(s)
Myers, M. Parker (Marion Parker)
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Advisor
Anant Balakrishnan, John G. Kassakian.
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Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. Includes bibliographical references (leaf 60).
Date issued
1996Department
Sloan School of Management; Massachusetts Institute of Technology. Department of Electrical Engineering and Computer SciencePublisher
Massachusetts Institute of Technology
Keywords
Sloan School of Management, Electrical Engineering and Computer Science