Improving production testing of RF products in a noisy measurement environment

Author(s)
Myers, M. Parker (Marion Parker)
Thumbnail
DownloadFull printable version (4.296Mb)
Advisor
Anant Balakrishnan, John G. Kassakian.
Terms of use
M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582
Metadata
Show full item record
Description
Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.
 
Includes bibliographical references (leaf 60).
 
Date issued
1996
URI
http://hdl.handle.net/1721.1/10942
Department
Sloan School of Management; Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Publisher
Massachusetts Institute of Technology
Keywords
Sloan School of Management, Electrical Engineering and Computer Science
Collections