| dc.contributor.advisor | Anant Balakrishnan, John G. Kassakian. | en_US |
| dc.contributor.author | Myers, M. Parker (Marion Parker) | en_US |
| dc.date.accessioned | 2005-08-18T15:26:11Z | |
| dc.date.available | 2005-08-18T15:26:11Z | |
| dc.date.copyright | 1996 | en_US |
| dc.date.issued | 1996 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/10942 | |
| dc.description | Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1996, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996. | en_US |
| dc.description | Includes bibliographical references (leaf 60). | en_US |
| dc.description.statementofresponsibility | by M. Parker Myers. | en_US |
| dc.format.extent | 60 leaves | en_US |
| dc.format.extent | 4505077 bytes | |
| dc.format.extent | 4504834 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | eng | en_US |
| dc.publisher | Massachusetts Institute of Technology | en_US |
| dc.rights | M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. | en_US |
| dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | |
| dc.subject | Sloan School of Management | en_US |
| dc.subject | Electrical Engineering and Computer Science | en_US |
| dc.title | Improving production testing of RF products in a noisy measurement environment | en_US |
| dc.type | Thesis | en_US |
| dc.description.degree | M.S. | en_US |
| dc.contributor.department | Sloan School of Management | en_US |
| dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
| dc.identifier.oclc | 35748415 | en_US |
