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dc.contributor.advisorStuart B. Brown.en_US
dc.contributor.authorBulsara, Mayank T. (Mayank Thakordas)en_US
dc.date.accessioned2007-07-18T13:35:58Z
dc.date.available2007-07-18T13:35:58Z
dc.date.copyright1995en_US
dc.date.issued1995en_US
dc.identifier.urihttp://hdl.handle.net/1721.1/38097
dc.descriptionThesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1995.en_US
dc.descriptionIncludes bibliographical references (leaves 24-25).en_US
dc.description.statementofresponsibilityby Mayank T. Bulsara.en_US
dc.format.extent26 leavesen_US
dc.language.isoengen_US
dc.publisherMassachusetts Institute of Technologyen_US
dc.rightsM.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission.en_US
dc.rights.urihttp://dspace.mit.edu/handle/1721.1/7582
dc.subjectMaterials Science and Engineeringen_US
dc.titleLoad deflection analysis for determining mechanical properties of thin films with tensile and compressive residual stressesen_US
dc.typeThesisen_US
dc.description.degreeM.S.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Materials Science and Engineering
dc.identifier.oclc33960838en_US


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