dc.contributor.advisor | Karl K. Berggren. | en_US |
dc.contributor.author | Winston, Donald, S.M. Massachusetts Institute of Technology | en_US |
dc.contributor.other | Massachusetts Institute of Technology. Dept. of Electrical Engineering and Computer Science. | en_US |
dc.date.accessioned | 2008-11-07T18:58:10Z | |
dc.date.available | 2008-11-07T18:58:10Z | |
dc.date.copyright | 2008 | en_US |
dc.date.issued | 2008 | en_US |
dc.identifier.uri | http://hdl.handle.net/1721.1/43065 | |
dc.description | Thesis (S.M.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 2008. | en_US |
dc.description | Includes bibliographical references (p. 53-54). | en_US |
dc.description.abstract | In this thesis, I investigate one approach - stimulated emission depletion - to surmounting the diffraction limitation of optical lithography. This approach uses farfield optical nodes to orchestrate reversible, saturable optical transitions in certain photoresist compounds. After addressing prior work in resolution enhancement via optical nodes (for metastable atom localization, reversible absorbance modulation, and fluorescence microscopy), I examine the issues of resist formulation, optical pulse width bounds due to resist kinetics, and patterning schemes for low- and high-volume throughput. The experimental realization of stimulated emission depletion is described, and challenges for lithography using this technique are discussed. | en_US |
dc.description.statementofresponsibility | by Donald Winston. | en_US |
dc.format.extent | 54 p. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Massachusetts Institute of Technology | en_US |
dc.rights | M.I.T. theses are protected by
copyright. They may be viewed from this source for any purpose, but
reproduction or distribution in any format is prohibited without written
permission. See provided URL for inquiries about permission. | en_US |
dc.rights.uri | http://dspace.mit.edu/handle/1721.1/7582 | en_US |
dc.subject | Electrical Engineering and Computer Science. | en_US |
dc.title | Nodal photolithography : lithography via far-field optical nodes in the resist | en_US |
dc.type | Thesis | en_US |
dc.description.degree | S.M. | en_US |
dc.contributor.department | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science | |
dc.identifier.oclc | 244105802 | en_US |