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12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry, January (IAP) 2006

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Title: 12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry, January (IAP) 2006
Author: Chatterjee, Nilanjan; Grove, Timothy L.
Issue Date: 2006-01
Abstract: Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe. From the course home page: Course Description This lab-oriented course introduces the student to the subject of X-ray spectrometry and micro-scale chemical quantitative analysis of solid samples through an intensive series of hands-on laboratory exercises that use the electron microprobe.
URI: http://hdl.handle.net/1721.1/55816
Other Identifiers: 12.141-January(IAP)2006
Other Identifiers: 12.141
IMSCP-MD5-aae8a5fa8b0e9fb0df31bfa0239f5ac0
Is Based On http://hdl.handle.net/1721.1/35789
http://mit-ocw.sbu.ac.ir/Default.aspx?tabid=4274
Keywords: x-ray microanalysis, electron microprobe, ZAF matrix corrections, wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging, 400601, Geology/Earth Science, General, 400502, Analytical Chemistry

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