Kleppner, Daniel; Pritchard, David E.; Ketterle, Wolfgang; DeVries, Joel C.; Ducas, Theodore W.; Holley, Jeffrey R.; Spellmeyer, Neal W.; Smith, Edward T.; Rubenstein, Richard A.; Kokorowski, David A.; Roberts, Tony; Yao, Huan; Dhirani, Al-Amin; Bradley, Michael P.; Rainville, Simon; Thompson, James R.; Nguyen, Roland N.; Porto, James V.; Miesner, Hans-Joachim; Raman, Chandra S.; Stenger, Jörn; Townsend, Christopher G.; Onofrio, Roberto; Andrews, Michael R.; Chikkatur, Ananth P.; Durfee, Dallin S.; Inouye, Shin; Kuklewicz, Christopher E.; Stamper-Kurn, Dan M.; Vogels, Johnny M.
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1997-01-01)