Allen, Jonathan; Wyatt, John L., Jr.; White, Jacob K.; Devadas, Srinivas; Chandrakasan, Anantha P.; Masaki, Ichiro; Dynes, Scott B. C.; Ehrlich, Michael S.; Terman, Christopher J.; Horn, Berthold K. P.; Lee, Hae-Seung; Schmidt, Martin A.; Sodini, Charles G.; Bergendahl, Jason R.; Decker, Steven J.; Frumkin, Stanislav E.; Gealow, Jeffrey C.; Martin, David A.; Wang, Chig-Chun; Engels, Daniel W.; Hadjiyiannis, George I.; Hanono, Silvina Z.; Fallah, Farzan; Beskok, Ali; Korsmeyer, F. Thomas; Lee, Chang Ho; Newman, J. Nicholas; Aluru, Narayana R.; Senturia, Stephen D.; Wang, Junfeng; Nastov, Ogden J.; Phillips, Joel R.; van der Zant, Herre S. J.; Orlando, Terry P.; Chou, Michael T.; Kamon, Mattan; Massoud, Yehia M.; Tausch, Johannes; Elfadel, Ibrahim M.; Li, Jing-Rebecca
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1996-01-01)