Browsing RLE Progress Report, No. 139 (1996) by Subject "Signatures of Surface Defects"

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    • Semiconductor Surface Studies 

      Joannopoulos, John D.; Cho, Kyeongjae; Villeneuve, Pierre R.; Capaz, Rodrigo B.; Fan, Shanhui; e.a. (Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1996-01-01)