Bekefi, George; Bers, Abraham; Coppi, Bruno; Porkolab, Miklos; Wurtele, Jonathan S.; Migliuolo, Stefano; Ram, Abhay K.; Sugiyama, Linda E.; Mastovsky, Ivan; Haus, Hermann A.; Stoner, Richard E.; Catravas, Palmyra E.; Babzien, Marcus; Batchelor, Ken; Ben-Zvi, Ilan; Fang, Jimmy; Fisher, Alan S.; Graves, William; Segalov, Zvi; Qiu, Joe; Wang, Xi-Jie; Fuchs, Vladimir; Schultz, Steven D.; Theilhaber, Joachim S.; Vacca, Luigi; Galicia, Felicisimo W.; Airoldi, Augusta; Bertin, Giuseppe; Bombarda, Francesca; Carpignano, Franco; Cenacchi, Giovanna; Contos, Marika; Daughton, William S.; Detragiache, Paolo; Erba, Matteo; Ernst, Darin R.; Felice, Gianmarco M.; Kuang, MöH; Lewis, Kevin; Maggiora, Riccardo; Pegoraro, Francesco; Penn, Gregory E.; Reich, Evan H.; Riccitelli, Marco; Riconda, Caterina; Roy, Jeremy; Salihu, Suraj D.; Svolos, George M.; Tanaka, Motohiko
(Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT), 1995-01-01)