| dc.contributor.author | Joannopoulos, John D. | en_US |
| dc.contributor.author | Cho, Kyeongjae | en_US |
| dc.contributor.author | Villeneuve, Pierre R. | en_US |
| dc.contributor.author | Capaz, Rodrigo B. | en_US |
| dc.contributor.author | Fan, Shanhui | en_US |
| dc.contributor.author | Park, Ickjin | en_US |
| dc.contributor.author | O'Meara, Margaret E. | en_US |
| dc.date.accessioned | 2010-07-17T01:07:36Z | |
| dc.date.available | 2010-07-17T01:07:36Z | |
| dc.date.issued | 1996-01-01 to 1996-12-31 | en_US |
| dc.identifier | RLE_PR_139_01_04s_02 | en_US |
| dc.identifier.uri | http://hdl.handle.net/1721.1/57367 | |
| dc.description | Contains an introduction, reports on two research projects, and a list of publications. | en_US |
| dc.description.sponsorship | Joint Services Electronics Program Grant DAAH04-95-1-0038 | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Research Laboratory of Electronics (RLE) at the Massachusetts Institute of Technology (MIT) | en_US |
| dc.relation.ispartof | Massachusetts Institute of Technology, Research Laboratory of Electronics, Progress Report, January 1 - December 31, 1996 | en_US |
| dc.relation.ispartof | Solid State Physics, Electronics and Optics | en_US |
| dc.relation.ispartof | Surfaces and Interfaces | en_US |
| dc.relation.ispartof | Semiconductor Surface Studies | en_US |
| dc.relation.ispartofseries | Massachusetts Institute of Technology. Research Laboratory of Electronics. Progress Report, no. 139 | en_US |
| dc.rights | Copyright (c) 2008 by the Massachusetts Institute of Technology. All rights reserved. | en_US |
| dc.subject.other | Semiconductor Surface Studies | en_US |
| dc.subject.other | Flipping Dimers on the Si(100) Surface | en_US |
| dc.subject.other | Signatures of Bulk Defects | en_US |
| dc.subject.other | Signatures of Surface Defects | en_US |
| dc.title | Semiconductor Surface Studies | en_US |
| dc.type | Technical Report | en_US |
