A methodology for manufacturing process signature analysis

Author(s)
Eppinger, Steven Daniel.; Huber, Christopher D.; Pham, Van H.
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Date issued
1993
URI
http://hdl.handle.net/1721.1/48471
Publisher
Cambridge, Mass. : Alfred P. Sloan School of Management, Massachusetts Institute of Technology
Other identifiers
methodologyforma00eppi
Series/Report no.
Working paper (Sloan School of Management) ; 3631.
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