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A methodology for manufacturing process signature analysis

dc.contributor.authorEppinger, Steven Daniel.en_US
dc.contributor.authorHuber, Christopher D.en_US
dc.contributor.authorPham, Van H.en_US
dc.date.accessioned2009-10-03T03:25:53Z
dc.date.available2009-10-03T03:25:53Z
dc.date.issued1993en_US
dc.identifiermethodologyforma00eppien_US
dc.identifier.urihttp://hdl.handle.net/1721.1/48471
dc.publisherCambridge, Mass. : Alfred P. Sloan School of Management, Massachusetts Institute of Technologyen_US
dc.relation.ispartofseriesWorking paper (Sloan School of Management) ; 3631.en_US
dc.titleA methodology for manufacturing process signature analysisen_US
dc.typeWorking Paperen_US
dc.identifier.oclc29490224en_US
dc.identifier.aleph000669076en_US


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