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dc.contributor.authorXu, W.
dc.date.accessioned2016-02-19T00:36:22Z
dc.date.available2016-02-19T00:36:22Z
dc.date.issued2011-01
dc.date.submitted2010-12
dc.identifier.issn03702693
dc.identifier.urihttp://hdl.handle.net/1721.1/101214
dc.description.abstractWe report the first, kinematically-complete measurement of the differential cross section of ϕ-meson photoproduction from deuterium near the production threshold for a proton using the CLAS detector and a tagged-photon beam in Hall B at Jefferson Lab. The measurement was carried out by a triple coincidence detection of a proton, K[superscript +] and K[superscript −] near the theoretical production threshold of 1.57 GeV. The extracted differential cross sections dσ/dt for the initial photon energy range of 1.65–1.75 GeV are consistent with predictions based on a quasifree mechanism. Our finding is different from recent LEPS results on ϕ-meson photoproduction from deuterium in a similar incident photon energy range, but in a different momentum transfer region.en_US
dc.description.sponsorshipUnited States. Dept. of Energyen_US
dc.description.sponsorshipNational Science Foundation (U.S.)en_US
dc.language.isoen_US
dc.publisherElsevieren_US
dc.relation.isversionofhttp://dx.doi.org/10.1016/j.physletb.2010.12.065en_US
dc.rightsCreative Commons Attribution-Noncommercial-NoDerivativesen_US
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/en_US
dc.sourceMIT Web Domainen_US
dc.titleNear-threshold photoproduction of ϕ mesons from deuteriumen_US
dc.typeArticleen_US
dc.identifier.citationQian, X., W. Chen, H. Gao, K. Hicks, K. Kramer, J.M. Laget, T. Mibe, et al. “Near-Threshold Photoproduction of ϕ Mesons from Deuterium.” Physics Letters B 696, no. 4 (February 2011): 338–342.en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Physicsen_US
dc.contributor.mitauthorXu, W.en_US
dc.relation.journalPhysics Letters Ben_US
dc.eprint.versionAuthor's final manuscripten_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dspace.orderedauthorsQian, X.; Chen, W.; Gao, H.; Hicks, K.; Kramer, K.; Laget, J.M.; Mibe, T.; Qiang, Y.; Stepanyan, S.; Tedeschi, D.J.; Xu, W.; Adhikari, K.P.; Amaryan, M.; Anghinolfi, M.; Ball, J.; Battaglieri, M.; Batourine, V.; Bedlinskiy, I.; Bellis, M.; Biselli, A.S.; Bookwalter, C.; Branford, D.; Briscoe, W.J.; Brooks, W.K.; Burkert, V.D.; Careccia, S.L.; Carman, D.S.; Cole, P.L.; Collins, P.; Crede, V.; D'Angelo, A.; Daniel, A.; Dashyan, N.; De Vita, R.; De Sanctis, E.; Deur, A.; Dey, B.; Dhamija, S.; Djalali, C.; Doughty, D.; Dupre, R.; Egiyan, H.; El Alaoui, A.; Eugenio, P.; Fegan, S.; Gabrielyan, M.Y.; Gevorgyan, N.; Gilfoyle, G.P.; Giovanetti, K.L.; Girod, F.X.; Goetz, J.T.; Gohn, W.; Gothe, R.W.; Graham, L.; Griffioen, K.A.; Guidal, M.; Guo, L.; Hafidi, K.; Hakobyan, H.; Hanretty, C.; Hassall, N.; Holtrop, M.; Ilieva, Y.; Ireland, D.G.; Jawalkar, S.S.; Jo, H.S.; Joo, K.; Keller, D.; Khandaker, M.; Khetarpal, P.; Kim, A.; Kim, W.; Klein, A.; Klein, F.J.; Konczykowski, P.; Kubarovsky, V.; Kuleshov, S.V.; Kuznetsov, V.; Livingston, K.; Martinez, D.; Mayer, M.; McAndrew, J.; McCracken, M.E.; McKinnon, B.; Meyer, C.A.; Mikhailov, K.; Mineeva, T.; Mirazita, M.; Mokeev, V.; Moreno, B.; Moriya, K.; Morrison, B.; Moutarde, H.; Munevar, E.; Nadel-Turonski, P.; Ni, A.; Niccolai, S.; Niculescu, I.; Niroula, M.R.; Osipenko, M.; Ostrovidov, A.I.; Paremuzyan, R.; Park, K.; Park, S.; Pereira, S. Anefalos; Pisano, S.; Pogorelko, O.; Pozdniakov, S.; Price, J.W.; Procureur, S.; Protopopescu, D.; Ricco, G.; Ripani, M.; Ritchie, B.G.; Rosner, G.; Rossi, P.; Sabatié, F.; Saini, M.S.; Salgado, C.; Schott, D.; Schumacher, R.A.; Seder, E.; Seraydaryan, H.; Sharabian, Y.G.; Smith, E.S.; Smith, G.D.; Sober, D.I.; Sokhan, D.; Stepanyan, S.S.; Stoler, P.; Strakovsky, I.I.; Strauch, S.; Taiuti, M.; Taylor, C.E.; Tkachenko, S.; Ungaro, M.; Vernarsky, B.; Vineyard, M.F.; Voutier, E.; Weinstein, L.B.; Weygand, D.P.; Wood, M.H.; Zachariou, N.; Zana, L.; Zhang, J.; Zhao, B.; Zhao, Z.W.en_US
mit.licensePUBLISHER_CCen_US


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