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dc.contributor.authorYang, Samuel J
dc.contributor.authorBerndl, Marc
dc.contributor.authorMichael Ando, D.
dc.contributor.authorNarayanaswamy, Arunachalam
dc.contributor.authorChristiansen, Eric
dc.contributor.authorHoyer, Stephan
dc.contributor.authorRoat, Chris
dc.contributor.authorRueden, Curtis T
dc.contributor.authorShankar, Asim
dc.contributor.authorFinkbeiner, Steven
dc.contributor.authorNelson, Philip
dc.contributor.authorYang, Samuel J.
dc.contributor.authorRueden, Curtis T.
dc.contributor.authorBarch, Mariya
dc.contributor.authorHung, Jane Yen
dc.date.accessioned2018-04-12T15:43:30Z
dc.date.available2018-04-12T15:43:30Z
dc.date.issued2018-03
dc.date.submitted2017-10
dc.identifier.issn1471-2105
dc.identifier.urihttp://hdl.handle.net/1721.1/114668
dc.description.abstractBackground Large image datasets acquired on automated microscopes typically have some fraction of low quality, out-of-focus images, despite the use of hardware autofocus systems. Identification of these images using automated image analysis with high accuracy is important for obtaining a clean, unbiased image dataset. Complicating this task is the fact that image focus quality is only well-defined in foreground regions of images, and as a result, most previous approaches only enable a computation of the relative difference in quality between two or more images, rather than an absolute measure of quality. Results We present a deep neural network model capable of predicting an absolute measure of image focus on a single image in isolation, without any user-specified parameters. The model operates at the image-patch level, and also outputs a measure of prediction certainty, enabling interpretable predictions. The model was trained on only 384 in-focus Hoechst (nuclei) stain images of U2OS cells, which were synthetically defocused to one of 11 absolute defocus levels during training. The trained model can generalize on previously unseen real Hoechst stain images, identifying the absolute image focus to within one defocus level (approximately 3 pixel blur diameter difference) with 95% accuracy. On a simpler binary in/out-of-focus classification task, the trained model outperforms previous approaches on both Hoechst and Phalloidin (actin) stain images (F-scores of 0.89 and 0.86, respectively over 0.84 and 0.83), despite only having been presented Hoechst stain images during training. Lastly, we observe qualitatively that the model generalizes to two additional stains, Hoechst and Tubulin, of an unseen cell type (Human MCF-7) acquired on a different instrument. Conclusions Our deep neural network enables classification of out-of-focus microscope images with both higher accuracy and greater precision than previous approaches via interpretable patch-level focus and certainty predictions. The use of synthetically defocused images precludes the need for a manually annotated training dataset. The model also generalizes to different image and cell types. The framework for model training and image prediction is available as a free software library and the pre-trained model is available for immediate use in Fiji (ImageJ) and CellProfiler.en_US
dc.publisherBioMed Centralen_US
dc.relation.isversionofhttp://dx.doi.org/10.1186/s12859-018-2087-4en_US
dc.rightsCreative Commons Attributionen_US
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en_US
dc.sourceBioMed Centralen_US
dc.titleAssessing microscope image focus quality with deep learningen_US
dc.typeArticleen_US
dc.identifier.citationYang, Samuel J. et al. "Assessing microscope image focus quality with deep learning." BMC Bioinformatics 2018, 19 (March 2018): 77 © 2018 The Author(s)en_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Biological Engineeringen_US
dc.contributor.departmentMassachusetts Institute of Technology. Department of Chemical Engineeringen_US
dc.contributor.mitauthorBarch, Mariya
dc.contributor.mitauthorHung, Jane Yen
dc.relation.journalBMC Bioinformaticsen_US
dc.eprint.versionFinal published versionen_US
dc.type.urihttp://purl.org/eprint/type/JournalArticleen_US
eprint.statushttp://purl.org/eprint/status/PeerRevieweden_US
dc.date.updated2018-03-18T04:12:02Z
dc.language.rfc3066en
dc.rights.holderThe Author(s).
dspace.orderedauthorsYang, Samuel J.; Berndl, Marc; Michael Ando, D.; Barch, Mariya; Narayanaswamy, Arunachalam; Christiansen, Eric; Hoyer, Stephan; Roat, Chris; Hung, Jane; Rueden, Curtis T.; Shankar, Asim; Finkbeiner, Steven; Nelson, Philipen_US
dspace.embargo.termsNen_US
mit.licensePUBLISHER_CCen_US


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